This AFM is the most innovative, versatile and flexible platform for morphological investigation of materials. This instrument offers the broadest range of AFM modes and applications (Tapping, Contact, Phase Imaging) and is equipped with the proprietary ScanAsyst® automatic image optimization technology, which enables easier, faster, and more consistent results, regardless of user skill level.
Delivering highest performance on any AFM sample
• High resolution (lateral 5-10 nm)
• Reduced noise (< 30 pm)
Providing quantitative nanoscale material property mapping
• Nanomechanical properties
• Electrical characterization
• Tunneling Atomic Force