Labrini Sygellou
Education:
• Bachelor, Dept. of Physics, University of Ioannina, Greece, 1999
• MSc, Materials Science and Technology, University of Patras, Department of Chemical Engineering, Greece, 2005
• PhD, Chemical Engineering, University of Patras, Department of Chemical Engineering, Greece, 2005
Research activities:
• Characterization of thin films (oligomers, metals, oxides, Graphene, and Graphene-like materials) with surface science techniques: XPS, UPS, EELS
• Physics and Chemistry of solid surfaces, interaction of gases, metals and organic compounds with metallic and semiconducting surfaces
• Preparation and characterization of thin films (oligomers, metals or oxides) with controlled thickness and dispersion on oxide or metal or Graphene-like substrates for the study of their electronic, optical and structural properties (application in optoelectronics
Representative publications:
- The Effect of Organic and Metal Oxide Interfacial layerson the Performance of Inverted Organic Photovoltaics, A. Savva , F. Petraki , P. Elefteriou , L. Sygellou ,M. Voigt , M. Giannouli , S. Kennou , J. Nelson , D. D. C. Bradley ,Ch. J. Brabec , and S. A. Choulis, Adv. Energy Mater. 2012, DOI: 10.1002/aenm.201200317
- An X-ray photoelectron spectroscopy study of ultra-thin oxynitride films, S. Ladas, L. Sygellou, S. Kennou, M. Wolf, G. Roeder, A. Nutsch, M. Rambach, W. Lerch, Thin Solid Films (2011), 520 (2) 871-875
- Interfacial effects in ultra-thin nickel deposits on yttria-stabilized zirconia, L. Sygellou and S. Ladas, Surface Science 566-568, (2004), 698-702